<?xml version="1.0"?>
<!DOCTYPE article
PUBLIC "-//NLM//DTD JATS (Z39.96) Journal Publishing DTD v1.4 20190208//EN"
       "JATS-journalpublishing1.dtd">
<article xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" article-type="research-article" dtd-version="1.4" xml:lang="en">
 <front>
  <journal-meta>
   <journal-id journal-id-type="publisher-id">Modeling of systems and processes</journal-id>
   <journal-title-group>
    <journal-title xml:lang="en">Modeling of systems and processes</journal-title>
    <trans-title-group xml:lang="ru">
     <trans-title>Моделирование систем и процессов</trans-title>
    </trans-title-group>
   </journal-title-group>
   <issn publication-format="print">2219-0767</issn>
  </journal-meta>
  <article-meta>
   <article-id pub-id-type="publisher-id">110767</article-id>
   <article-id pub-id-type="doi">10.12737/2219-0767-2025-18-4-12-25</article-id>
   <article-categories>
    <subj-group subj-group-type="toc-heading" xml:lang="ru">
     <subject>Технические науки</subject>
    </subj-group>
    <subj-group subj-group-type="toc-heading" xml:lang="en">
     <subject></subject>
    </subj-group>
    <subj-group>
     <subject>Технические науки</subject>
    </subj-group>
   </article-categories>
   <title-group>
    <article-title xml:lang="en">Methods for ensuring the reliability of electronic equipment design during design</article-title>
    <trans-title-group xml:lang="ru">
     <trans-title>Методы обеспечения надежности конструкции электронной аппаратуры при проектировании</trans-title>
    </trans-title-group>
   </title-group>
   <contrib-group content-type="authors">
    <contrib contrib-type="author">
     <name-alternatives>
      <name xml:lang="ru">
       <surname>Каськов</surname>
       <given-names>Тимофей Николаевич</given-names>
      </name>
      <name xml:lang="en">
       <surname>Kas'kov</surname>
       <given-names>Timofey Nikolaevich</given-names>
      </name>
     </name-alternatives>
    </contrib>
    <contrib contrib-type="author">
     <name-alternatives>
      <name xml:lang="ru">
       <surname>Грошева</surname>
       <given-names>Екатерина Владимировна</given-names>
      </name>
      <name xml:lang="en">
       <surname>Grosheva</surname>
       <given-names>Ekaterina Vladimirovna</given-names>
      </name>
     </name-alternatives>
     <xref ref-type="aff" rid="aff-1"/>
     <xref ref-type="aff" rid="aff-2"/>
    </contrib>
    <contrib contrib-type="author">
     <name-alternatives>
      <name xml:lang="ru">
       <surname>Оксюта</surname>
       <given-names>Олеся Владимировна</given-names>
      </name>
      <name xml:lang="en">
       <surname>Oksyuta</surname>
       <given-names>O. V.</given-names>
      </name>
     </name-alternatives>
     <xref ref-type="aff" rid="aff-3"/>
    </contrib>
    <contrib contrib-type="author">
     <name-alternatives>
      <name xml:lang="ru">
       <surname>Зольников</surname>
       <given-names>Владимир Константинович</given-names>
      </name>
      <name xml:lang="en">
       <surname>Zolnikov</surname>
       <given-names>V. K.</given-names>
      </name>
     </name-alternatives>
     <xref ref-type="aff" rid="aff-3"/>
    </contrib>
   </contrib-group>
   <aff-alternatives id="aff-1">
    <aff>
     <institution xml:lang="ru">Воронежский государственный лесотехнический университет имени Г.Ф. Морозова</institution>
     <country>Россия</country>
    </aff>
    <aff>
     <institution xml:lang="en">Voronezh State University of Forestry and Technologies named after G.F. Morozov</institution>
     <country>Russian Federation</country>
    </aff>
   </aff-alternatives>
   <aff-alternatives id="aff-2">
    <aff>
     <institution xml:lang="ru">АО &quot;Научно-исследовательский институт электронной техники&quot;</institution>
     <country>Россия</country>
    </aff>
    <aff>
     <institution xml:lang="en">АО &quot;Научно-исследовательский институт электронной техники&quot;</institution>
     <country>Russian Federation</country>
    </aff>
   </aff-alternatives>
   <aff-alternatives id="aff-3">
    <aff>
     <institution xml:lang="ru">Воронежский государственный лесотехнический университет имени Г.Ф. Морозова</institution>
    </aff>
    <aff>
     <institution xml:lang="en">Voronezh State University of Forestry and Technologies named after G.F. Morozov</institution>
    </aff>
   </aff-alternatives>
   <pub-date publication-format="print" date-type="pub" iso-8601-date="2025-12-23T11:32:36+03:00">
    <day>23</day>
    <month>12</month>
    <year>2025</year>
   </pub-date>
   <pub-date publication-format="electronic" date-type="pub" iso-8601-date="2025-12-23T11:32:36+03:00">
    <day>23</day>
    <month>12</month>
    <year>2025</year>
   </pub-date>
   <volume>18</volume>
   <issue>4</issue>
   <fpage>12</fpage>
   <lpage>25</lpage>
   <history>
    <date date-type="received" iso-8601-date="2025-12-22T00:00:00+03:00">
     <day>22</day>
     <month>12</month>
     <year>2025</year>
    </date>
   </history>
   <self-uri xlink:href="https://zh-szf.ru/en/nauka/article/110767/view">https://zh-szf.ru/en/nauka/article/110767/view</self-uri>
   <abstract xml:lang="ru">
    <p>Статья посвящена всестороннему рассмотрению методов обеспечения надёжности конструкций радиоэлектронной аппаратуры (РЭА) при проектировании, с учётом специфики механических нагрузок и условий эксплуатации. Основное внимание уделяется процедурам расчёта и моделирования, необходимым для предсказания реакции конструкции на внешние воздействия. Анализируются наиболее распространенные виды нагрузок: статические, переменные, контактные и усталостные, а также предлагаются стратегии повышения прочностных характеристик конструкций, такие как введение ребер жесткости, оптимизация размещения крепёжных элементов и выбор материалов с высокими показателями эластичности и прочности.&#13;
Значительное место отведено вопросам обеспечения теплового режима РЭА, включая методики расчёта необходимой интенсивности охлаждения и правила организации воздушного потока внутри конструкции. Рассматриваются важнейшие факторы, влияющие на продолжительность жизненного цикла электронного оборудования, такие как перегрев и недопустимый износ комплектующих вследствие нагрева.&#13;
Отдельно выделяются проблемы электромагнитного экранирования, необходимые для защиты оборудования от внешних наводок и собственного внутреннего шума. Приводятся рекомендации по созданию эффективных экранирующих оболочек, а также обсуждена технология правильного подключения проводов и кабелей, исключающая проникновение посторонних сигналов внутрь конструкции.&#13;
Таким образом, статья станет ценным руководством для инженеров-проектировщиков, стремящихся создавать надежные и долговечные конструкции радиоэлектронной аппаратуры, способные успешно функционировать даже в экстремальных эксплуатационных условиях.</p>
   </abstract>
   <trans-abstract xml:lang="en">
    <p>The article is devoted to a comprehensive review of methods for ensuring the reliability of radioelectronic equipment (REA) structures during design, taking into account the specifics of mechanical loads and operating conditions. The main attention is paid to the calculation and modeling procedures necessary to predict the reaction of the structure to external influences. The most widespread types of loads are analyzed: static, variable, contact, and fatigue loads, and strategies for improving the strength characteristics of structures are proposed, such as the introduction of stiffeners, optimizing the placement of fasteners, and selecting materials with high elasticity and strength.&#13;
A significant place is devoted to the issues of ensuring the thermal regime of the REA, including methods for calculating the required cooling intensity and rules for organizing the air flow inside the structure. The most important factors affecting the life cycle of electronic equipment, such as overheating and unacceptable wear of components due to heating, are considered.&#13;
The problems of electromagnetic shielding necessary to protect equipment from external interference and its own internal noise are highlighted separately. Recommendations for the creation of effective shielding shells are given, and the technology for the correct connection of wires and cables, which prevents the penetration of extraneous signals into the structure, is discussed.&#13;
Thus, the article will become a valuable guide for design engineers seeking to create reliable and durable designs of radio electronic equipment that can function successfully even in extreme operating conditions.</p>
   </trans-abstract>
   <kwd-group xml:lang="ru">
    <kwd>радиоэлектронная аппаратура (РЭА)</kwd>
    <kwd>надёжность</kwd>
    <kwd>ме-ханические нагрузки</kwd>
    <kwd>тепловой режим</kwd>
    <kwd>экранирование</kwd>
    <kwd>электромагнитные волны</kwd>
    <kwd>расчёт</kwd>
    <kwd>проектирование</kwd>
    <kwd>материалы</kwd>
    <kwd>моделирование</kwd>
   </kwd-group>
   <kwd-group xml:lang="en">
    <kwd>radio electronic equipment (REA)</kwd>
    <kwd>reliability</kwd>
    <kwd>mechanical loads</kwd>
    <kwd>thermal regime</kwd>
    <kwd>shielding</kwd>
    <kwd>electromagnetic waves</kwd>
    <kwd>calculation</kwd>
    <kwd>design</kwd>
    <kwd>materials</kwd>
    <kwd>modeling</kwd>
   </kwd-group>
  </article-meta>
 </front>
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