<?xml version="1.0" encoding="UTF-8"?>
<!DOCTYPE article
PUBLIC "-//NLM//DTD JATS (Z39.96) Journal Publishing DTD v1.4 20190208//EN"
       "JATS-journalpublishing1.dtd">
<article xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" article-type="research-article" dtd-version="1.4" xml:lang="en">
 <front>
  <journal-meta>
   <journal-id journal-id-type="publisher-id">Automation and modeling in design and management</journal-id>
   <journal-title-group>
    <journal-title xml:lang="en">Automation and modeling in design and management</journal-title>
    <trans-title-group xml:lang="ru">
     <trans-title>Автоматизация и моделирование в проектировании и управлении</trans-title>
    </trans-title-group>
   </journal-title-group>
   <issn publication-format="print">2658-3488</issn>
   <issn publication-format="online">2658-6436</issn>
  </journal-meta>
  <article-meta>
   <article-id pub-id-type="publisher-id">126242</article-id>
   <article-id pub-id-type="doi">10.30987/2658-6436-2026-2-10-20</article-id>
   <article-categories>
    <subj-group subj-group-type="toc-heading" xml:lang="ru">
     <subject>Автоматизация и управление технологическими процессами и производствами, системы автоматизации проектирования</subject>
    </subj-group>
    <subj-group subj-group-type="toc-heading" xml:lang="en">
     <subject>Automation and control of technological processes and production, automated design systems</subject>
    </subj-group>
    <subj-group>
     <subject>Автоматизация и управление технологическими процессами и производствами, системы автоматизации проектирования</subject>
    </subj-group>
   </article-categories>
   <title-group>
    <article-title xml:lang="en">COMPARATIVE ANALYSIS OF SOFTWARE SOLUTIONS FOR AUTOMATED RECOGNITION OF INTEGRATED CIRCUIT TOPOLOGY</article-title>
    <trans-title-group xml:lang="ru">
     <trans-title>СРАВНИТЕЛЬНЫЙ АНАЛИЗ ПРОГРАММНЫХ РЕШЕНИЙ ДЛЯ АВТОМАТИЗАЦИИ РАСПОЗНАВАНИЯ ТОПОЛОГИИ ИНТЕГРАЛЬНЫХ СХЕМ</trans-title>
    </trans-title-group>
   </title-group>
   <contrib-group content-type="authors">
    <contrib contrib-type="author">
     <contrib-id contrib-id-type="orcid">https://orcid.org/0000-0003-2512-8206</contrib-id>
     <name-alternatives>
      <name xml:lang="ru">
       <surname>Малаханов</surname>
       <given-names>Алексей Алексеевич</given-names>
      </name>
      <name xml:lang="en">
       <surname>Malakhanov</surname>
       <given-names>Alexey Alexeevich</given-names>
      </name>
     </name-alternatives>
     <email>malakhan@yandex.ru</email>
     <bio xml:lang="ru">
      <p>кандидат технических наук;</p>
     </bio>
     <bio xml:lang="en">
      <p>candidate of technical sciences;</p>
     </bio>
     <xref ref-type="aff" rid="aff-1"/>
    </contrib>
    <contrib contrib-type="author">
     <contrib-id contrib-id-type="orcid">https://orcid.org/0009-0003-3057-9156</contrib-id>
     <name-alternatives>
      <name xml:lang="ru">
       <surname>Азарова</surname>
       <given-names>Кристина Максимовна</given-names>
      </name>
      <name xml:lang="en">
       <surname>Azarova</surname>
       <given-names>Kristina Maksimovna</given-names>
      </name>
     </name-alternatives>
     <xref ref-type="aff" rid="aff-2"/>
    </contrib>
    <contrib contrib-type="author">
     <contrib-id contrib-id-type="orcid">https://orcid.org/0009-0005-6941-0440</contrib-id>
     <name-alternatives>
      <name xml:lang="ru">
       <surname>Моисеев</surname>
       <given-names>Кирилл Андреевич</given-names>
      </name>
      <name xml:lang="en">
       <surname>Moiseyev</surname>
       <given-names>Kirill Andreevich</given-names>
      </name>
     </name-alternatives>
     <xref ref-type="aff" rid="aff-3"/>
    </contrib>
   </contrib-group>
   <aff-alternatives id="aff-1">
    <aff>
     <institution xml:lang="ru">Брянский государственный технический университет</institution>
     <city>Брянск</city>
     <country>Россия</country>
    </aff>
    <aff>
     <institution xml:lang="en">Bryansk State Technical University</institution>
     <city>Bryansk</city>
     <country>Russian Federation</country>
    </aff>
   </aff-alternatives>
   <aff-alternatives id="aff-2">
    <aff>
     <institution xml:lang="ru">Брянский государственный технический университет</institution>
     <country>Россия</country>
    </aff>
    <aff>
     <institution xml:lang="en">Bryansk State Technical University</institution>
     <country>Russian Federation</country>
    </aff>
   </aff-alternatives>
   <aff-alternatives id="aff-3">
    <aff>
     <institution xml:lang="ru">Брянский государственный технический университет</institution>
     <country>Россия</country>
    </aff>
    <aff>
     <institution xml:lang="en">Bryansk State Technical University</institution>
     <country>Russian Federation</country>
    </aff>
   </aff-alternatives>
   <pub-date publication-format="print" date-type="pub" iso-8601-date="2026-04-20T00:00:00+03:00">
    <day>20</day>
    <month>04</month>
    <year>2026</year>
   </pub-date>
   <pub-date publication-format="electronic" date-type="pub" iso-8601-date="2026-04-20T00:00:00+03:00">
    <day>20</day>
    <month>04</month>
    <year>2026</year>
   </pub-date>
   <volume>2026</volume>
   <issue>2</issue>
   <fpage>10</fpage>
   <lpage>20</lpage>
   <history>
    <date date-type="received" iso-8601-date="2026-03-18T00:00:00+03:00">
     <day>18</day>
     <month>03</month>
     <year>2026</year>
    </date>
    <date date-type="accepted" iso-8601-date="2026-04-14T00:00:00+03:00">
     <day>14</day>
     <month>04</month>
     <year>2026</year>
    </date>
   </history>
   <self-uri xlink:href="https://zh-szf.ru/en/nauka/article/126242/view">https://zh-szf.ru/en/nauka/article/126242/view</self-uri>
   <abstract xml:lang="ru">
    <p>Целью исследования является сравнительный анализ коммерческого и авторского программных средств для автоматизированного распознавания элементов топологии интегральных микросхем в задачах обратного проектирования. Задачей является определение специфических профилей ошибок каждого из рассматриваемых инструментов (коммерческого программного комплекса Pix2Net и авторского кода на языке Python/OpenCV) и формулирование рекомендаций по их улучшению. Методы исследования: экспериментальное распознавание элементов микросхем, изготовленных по БиКДМОП техпроцессу; анализ ошибок по методу Парето с классификацией на три категории (пропуск элемента, ложное срабатывание, геометрическая ошибка). Новизна работы состоит в сопоставлении нейросетевого и шаблонного подходов к распознаванию элементов топологии интегральных схем с выявлением компромисса между полнотой обнаружения и точностью детекции. Результаты исследования: Pix2Net обеспечивает точность 98 %, но порождает 78,9 % ложных срабатываний; авторский подход при точности 72 % демонстрирует доминирование пропусков (60 %) при низком уровне ложных детекций. Выводы: каждый подход обладает специфическим профилем ошибок; анализ Парето позволяет целенаправленно определить приоритетные направления улучшения, при этом авторский инструмент является перспективным для учебных и исследовательских целей благодаря отсутствию зависимости от GPU и коммерческих лицензий.</p>
   </abstract>
   <trans-abstract xml:lang="en">
    <p>The aim of this study is a comparative analysis of commercial and proprietary software tools designed for the automated recognition of integrated circuit (IC) topology elements in reverse engineering tasks. The objective is to determine the specific error profiles of each tool under consideration, namely the commercial Pix2Net software package and an author-developed Python/OpenCV code and to formulate recommendations for their improvement. The research methods include experimental recognition of IC elements fabricated using the BiCDMOS process; error analysis based on the Pareto principle with classification into three categories, namely element omission, false positive detection, and geometric error. The novelty of the work lies in comparing neural network-based and template-matching approaches to recognizing IC topology elements, revealing a trade-off between detection completeness and accuracy. The research results show that Pix2Net achieves an accuracy of 98% but generates 78.9% false positives, whereas the proprietary approach demonstrates an accuracy of 72% with omissions dominating at 60% while maintaining a low level of false detections. The conclusions indicate that each approach possesses a specific error profile. Pareto analysis allows for targeted identification of priority areas for improvement. Furthermore, the proprietary tool proves promising for educational and research purposes due to its independence from GPU hardware and commercial licenses.</p>
   </trans-abstract>
   <kwd-group xml:lang="ru">
    <kwd>реверс-инжиниринг</kwd>
    <kwd>интегральные схемы</kwd>
    <kwd>распознавание образов</kwd>
    <kwd>Pix2Net</kwd>
    <kwd>OpenCV</kwd>
    <kwd>СЭМ-изображения</kwd>
    <kwd>netlist</kwd>
    <kwd>GDSII</kwd>
    <kwd>анализ Парето</kwd>
    <kwd>БиКДМОП</kwd>
   </kwd-group>
   <kwd-group xml:lang="en">
    <kwd>reverse engineering</kwd>
    <kwd>integrated circuits</kwd>
    <kwd>pattern recognition</kwd>
    <kwd>Pix2Net</kwd>
    <kwd>OpenCV</kwd>
    <kwd>SEM images</kwd>
    <kwd>netlist</kwd>
    <kwd>GDSII</kwd>
    <kwd>Pareto analysis</kwd>
    <kwd>BiCDMOS</kwd>
   </kwd-group>
  </article-meta>
 </front>
 <body>
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