<?xml version="1.0"?>
<!DOCTYPE article
PUBLIC "-//NLM//DTD JATS (Z39.96) Journal Publishing DTD v1.4 20190208//EN"
       "JATS-journalpublishing1.dtd">
<article xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" article-type="research-article" dtd-version="1.4" xml:lang="en">
 <front>
  <journal-meta>
   <journal-id journal-id-type="publisher-id">NDT World</journal-id>
   <journal-title-group>
    <journal-title xml:lang="en">NDT World</journal-title>
    <trans-title-group xml:lang="ru">
     <trans-title>В мире неразрушающего контроля</trans-title>
    </trans-title-group>
   </journal-title-group>
   <issn publication-format="print">1609-3178</issn>
  </journal-meta>
  <article-meta>
   <article-id pub-id-type="publisher-id">12928</article-id>
   <article-id pub-id-type="doi">10.12737/21148</article-id>
   <article-categories>
    <subj-group subj-group-type="toc-heading" xml:lang="ru">
     <subject>Толщинометрия изделий и покрытий</subject>
    </subj-group>
    <subj-group subj-group-type="toc-heading" xml:lang="en">
     <subject>Thickness Measurements of Products and Coatings</subject>
    </subj-group>
    <subj-group>
     <subject>Толщинометрия изделий и покрытий</subject>
    </subj-group>
   </article-categories>
   <title-group>
    <article-title xml:lang="en">Industrial Applications of Energy Dispersive X-ray Fluorescent Analyzers</article-title>
    <trans-title-group xml:lang="ru">
     <trans-title>О промышленном применении энергодисперсионных рентгенофлуоресцентных анализаторов</trans-title>
    </trans-title-group>
   </title-group>
   <contrib-group content-type="authors">
    <contrib contrib-type="author">
     <name-alternatives>
      <name xml:lang="ru">
       <surname>Петришин </surname>
       <given-names>Алексей  Владимирович</given-names>
      </name>
      <name xml:lang="en">
       <surname>Petrishin </surname>
       <given-names>Aleksey  Владимирович</given-names>
      </name>
     </name-alternatives>
     <email>a.petrishin@seifert-roentgen.com</email>
    </contrib>
   </contrib-group>
   <pub-date publication-format="print" date-type="pub" iso-8601-date="2016-09-20T00:00:00+03:00">
    <day>20</day>
    <month>09</month>
    <year>2016</year>
   </pub-date>
   <pub-date publication-format="electronic" date-type="pub" iso-8601-date="2016-09-20T00:00:00+03:00">
    <day>20</day>
    <month>09</month>
    <year>2016</year>
   </pub-date>
   <volume>19</volume>
   <issue>3</issue>
   <fpage>9</fpage>
   <lpage>12</lpage>
   <self-uri xlink:href="https://zh-szf.ru/en/nauka/article/12928/view">https://zh-szf.ru/en/nauka/article/12928/view</self-uri>
   <abstract xml:lang="ru">
    <p>Статья посвящена вопросам эффективного применения энергодисперсионных рентгенофлуоресцентных анализаторов в различных областях техники и промышленности. Рассмотрены основные принципы работы типичных систем, приведены примеры результатов измерений.</p>
   </abstract>
   <trans-abstract xml:lang="en">
    <p>Energy dispersive X-ray fluorescence analysis (ED XRF) enables the qualitative and quantitative elemental material composition to be determined, as well as thicknesses of multilayer coatings to be measured. Nowadays this method has been implemented in modern equipment, which is widely used both in laboratory measurements and in industry. The article describes the basic principles of the method and gives an overview of its different applications. Special attention is paid to the following industrial applications: thickness measurement of immersion gold on circuit boards; thickness measurement and composition of electroless Nickel; thickness measurements of electroplated tin; measurements of silicate coatings; measurements of turbine blade heat-resistant coatings. Experimental researches were carried out; measurements were made with the FISCHERSCOPE X-RAY analyzer manufactured by the company “HELMUT FISCHER GmbH” (Germany). The experimental results for different samples are presented as well as the ways of solving the arising problems. The ED XRF method has proven to be highly efficient for abovementioned industrial applications.&#13;
The growth of scientific and technological progress is creating new possibilities for wider application of the ED XRF method including problems of non-destructive testing.</p>
   </trans-abstract>
   <kwd-group xml:lang="ru">
    <kwd>рентгенофлуоресцентный анализ</kwd>
    <kwd>элементный состав</kwd>
    <kwd>многослойное покрытие</kwd>
    <kwd>толщина покрытия</kwd>
   </kwd-group>
   <kwd-group xml:lang="en">
    <kwd>X-ray fluorescence analysis</kwd>
    <kwd>elemental composition</kwd>
    <kwd>multilayer coating</kwd>
    <kwd>coating thickness</kwd>
   </kwd-group>
  </article-meta>
 </front>
 <body>
  <p></p>
 </body>
 <back>
  <ref-list>
   <ref id="B1">
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    <citation-alternatives>
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  </ref-list>
 </back>
</article>
