@article{Vatuev2024optimization,
author={Vatuev, A.S. and Sharapov, A.A. and Ozerov, A.I.},
title={Optimization of test methods and algorithms for assessing the resistance of field-effect transistors to various types of  radiation using promising test equipment},
journal={Modeling of systems and processes},
publisher={FSBE Institution of Higher Education Voronezh State University of Forestry and Technologies named after G.F. Morozov},
year={2024},
pages={16-25},
volume={17},
issue={3},
}