TY  JOUR
TI  Optimization of test methods and algorithms for assessing the resistance of field-effect transistors to various types of  radiation using promising test equipment
KW  Field effect resistance
KW  radiation exposure
KW  test methods
KW  SEB effect
KW  transistor responses
JO  Modeling of systems and processes
AU  Vatuev, A.S.
AU  Sharapov, A.A.
AU  Ozerov, A.I.
PY  2024
IS  17
PB  FSBE Institution of Higher Education Voronezh State University of Forestry and Technologies named after G.F. Morozov