00733naa#a2200205#i#450# EN\\bibl\8334 20251227102319.6 2308-8877 20151210b2015####ek#y0engy0150####ca RUS RU The specific use of methods of non-destructive diagnostics of semiconductor products after exposure to electrostatic discharges Journal article Voronezh FSBE Institution of Higher Education Voronezh State University of Forestry and Technologies named after G.F. Morozov 2015 4 с. Journal article local Degalevich Dmitriy Vrabiy Eduard Piskun Gennadiy Alekseev Viktor zh-szf.ru