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 <front>
  <journal-meta>
   <journal-id journal-id-type="publisher-id">Modeling of systems and processes</journal-id>
   <journal-title-group>
    <journal-title xml:lang="en">Modeling of systems and processes</journal-title>
    <trans-title-group xml:lang="ru">
     <trans-title>Моделирование систем и процессов</trans-title>
    </trans-title-group>
   </journal-title-group>
   <issn publication-format="print">2219-0767</issn>
  </journal-meta>
  <article-meta>
   <article-id pub-id-type="publisher-id">53293</article-id>
   <article-id pub-id-type="doi">10.12737/2219-0767-2022-15-3-110-128</article-id>
   <article-categories>
    <subj-group subj-group-type="toc-heading" xml:lang="ru">
     <subject>Физико-математические науки</subject>
    </subj-group>
    <subj-group subj-group-type="toc-heading" xml:lang="en">
     <subject></subject>
    </subj-group>
    <subj-group>
     <subject>Физико-математические науки</subject>
    </subj-group>
   </article-categories>
   <title-group>
    <article-title xml:lang="en">Overview of methods for measuring the mechanical strength of thin films</article-title>
    <trans-title-group xml:lang="ru">
     <trans-title>Обзор методов измерения механической прочности тонких плёнок</trans-title>
    </trans-title-group>
   </title-group>
   <contrib-group content-type="authors">
    <contrib contrib-type="author">
     <name-alternatives>
      <name xml:lang="ru">
       <surname>Беспалов</surname>
       <given-names>В. А.</given-names>
      </name>
      <name xml:lang="en">
       <surname>Bespalov</surname>
       <given-names>V. A.</given-names>
      </name>
     </name-alternatives>
     <xref ref-type="aff" rid="aff-1"/>
    </contrib>
    <contrib contrib-type="author">
     <name-alternatives>
      <name xml:lang="ru">
       <surname>Товарнов</surname>
       <given-names>Д. А.</given-names>
      </name>
      <name xml:lang="en">
       <surname>Tovarnov</surname>
       <given-names>D. A.</given-names>
      </name>
     </name-alternatives>
     <xref ref-type="aff" rid="aff-1"/>
    </contrib>
    <contrib contrib-type="author">
     <name-alternatives>
      <name xml:lang="ru">
       <surname>Дюжев</surname>
       <given-names>Н. А.</given-names>
      </name>
      <name xml:lang="en">
       <surname>Dyuzhev</surname>
       <given-names>N. A.</given-names>
      </name>
     </name-alternatives>
     <xref ref-type="aff" rid="aff-1"/>
    </contrib>
    <contrib contrib-type="author">
     <name-alternatives>
      <name xml:lang="ru">
       <surname>Махиборода</surname>
       <given-names>М. А.</given-names>
      </name>
      <name xml:lang="en">
       <surname>Mahiboroda</surname>
       <given-names>M. A.</given-names>
      </name>
     </name-alternatives>
     <xref ref-type="aff" rid="aff-1"/>
    </contrib>
    <contrib contrib-type="author">
     <name-alternatives>
      <name xml:lang="ru">
       <surname>Гусев</surname>
       <given-names>Е. Э.</given-names>
      </name>
      <name xml:lang="en">
       <surname>Gusev</surname>
       <given-names>E. E.</given-names>
      </name>
     </name-alternatives>
     <xref ref-type="aff" rid="aff-1"/>
    </contrib>
    <contrib contrib-type="author">
     <name-alternatives>
      <name xml:lang="ru">
       <surname>Зольников</surname>
       <given-names>Константин Владимирович</given-names>
      </name>
      <name xml:lang="en">
       <surname>Zolnikov</surname>
       <given-names>Konstantin Vladimirovich</given-names>
      </name>
     </name-alternatives>
     <xref ref-type="aff" rid="aff-2"/>
    </contrib>
   </contrib-group>
   <aff-alternatives id="aff-1">
    <aff>
     <institution xml:lang="ru">Национальный исследовательский университет «МИЭТ»</institution>
    </aff>
    <aff>
     <institution xml:lang="en">National Research University of Electronic Technology</institution>
    </aff>
   </aff-alternatives>
   <aff-alternatives id="aff-2">
    <aff>
     <institution xml:lang="ru">Воронежский государственный лесотехнический университет имени Г.Ф. Морозова</institution>
     <country>Россия</country>
    </aff>
    <aff>
     <institution xml:lang="en">Voronezh State University of Forestry and Technologies named after G.F. Morozov</institution>
     <country>Russian Federation</country>
    </aff>
   </aff-alternatives>
   <pub-date publication-format="print" date-type="pub" iso-8601-date="2022-10-05T20:59:06+03:00">
    <day>05</day>
    <month>10</month>
    <year>2022</year>
   </pub-date>
   <pub-date publication-format="electronic" date-type="pub" iso-8601-date="2022-10-05T20:59:06+03:00">
    <day>05</day>
    <month>10</month>
    <year>2022</year>
   </pub-date>
   <volume>15</volume>
   <issue>3</issue>
   <fpage>110</fpage>
   <lpage>128</lpage>
   <history>
    <date date-type="received" iso-8601-date="2022-10-05T00:00:00+03:00">
     <day>05</day>
     <month>10</month>
     <year>2022</year>
    </date>
   </history>
   <self-uri xlink:href="https://zh-szf.ru/en/nauka/article/53293/view">https://zh-szf.ru/en/nauka/article/53293/view</self-uri>
   <abstract xml:lang="ru">
    <p>В данной обзорной статье рассматриваются методы измерения основных механических свойств тонких пленок: испытание на растяжение, индентирование, оценка запаса механической прочности по кривизне системы пластина - тонкая плёнка, контроль выдуванием за счёт подачи избыточного давления, исследование с использованием деформированного и резонансного кантилевера. В процессе критического анализа отечественных и зарубежных литературных источников выявлены преимущества и недостатки методов, объяснена мотивация авторов для проведения подобных исследований. В дополнении к существующим широко используемым методам приведена оригинальная и относительно новая методика — использование электрического тока в качестве контролируемого средства приложения термомеханических напряжений к электрическим проводникам для характеристики их усталостного поведения. Также указаны подходы для повышения механической прочности тонких плёнок.</p>
   </abstract>
   <trans-abstract xml:lang="en">
    <p>This review article discusses methods for measuring the main mechanical properties of thin films: tensile testing, indentation, evaluation of the mechanical strength margin for the curvature of the plate-thin film system, bulge method and research using a deformed and resonant cantilever. In the process of critical analysis of domestic and foreign literary sources, the advantages and disadvantages of the methods were revealed; the authors' motivation for conducting such studies was explained. In addition to the existing widely used methods, an original and relatively new technique is given - the use of electric current as a controlled means of applying thermo mechanical stresses to electrical conductors to characterize their fatigue behavior. Approaches for increasing the mechanical strength of thin films are also indicated.</p>
   </trans-abstract>
   <kwd-group xml:lang="ru">
    <kwd>механические свойства</kwd>
    <kwd>прочность</kwd>
    <kwd>предел текучести</kwd>
    <kwd>механические напряжения</kwd>
    <kwd>модуль Юнга</kwd>
    <kwd>размер зерна</kwd>
    <kwd>усталость материала</kwd>
    <kwd>тонкие плёнки</kwd>
    <kwd>дефекты</kwd>
    <kwd>деформация</kwd>
    <kwd>МЭМС</kwd>
   </kwd-group>
   <kwd-group xml:lang="en">
    <kwd>Mechanical properties</kwd>
    <kwd>strength</kwd>
    <kwd>yield strength</kwd>
    <kwd>mechanical stresses</kwd>
    <kwd>Young's modulus</kwd>
    <kwd>grain size</kwd>
    <kwd>material fatigue</kwd>
    <kwd>thin films</kwd>
    <kwd>defects</kwd>
    <kwd>deformation</kwd>
    <kwd>MEMS</kwd>
   </kwd-group>
  </article-meta>
 </front>
 <body>
  <p></p>
 </body>
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