AO "Nauchno-issledovatel'skiy institut elektronnoy tehniki"
Russian Federation
Russian Federation
Filial Rostovskogo gosudarstvennogo universiteta putey soobscheniya v g. Voronezhe
Russian Federation
UDK 60 Прикладные науки. Общие вопросы
The essence of the method discussed in the article is to test the product of the electronic component base of the ECB, which uses methods of parrying failures, with the system of parrying failures disabled according to standard test methods. This method is effective if the direct method cannot be applied, due to the fact that the flow of TKP reaches such a value that, the correction scheme will not be able to handle the failures that occur.
chip, operability, test interval, multiple failures, parameters, simulation, cell sensitivity, efficiency, test methods
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